In Situ Observation of Voltage-Induced Multilevel Resistive Switching in Solid Electrolyte Memory
DC Field | Value | Language |
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dc.contributor.author | Choi, Sang-Jun | - |
dc.contributor.author | Park, Gyeong-Su | - |
dc.contributor.author | Kim, Ki-Hong | - |
dc.contributor.author | Cho, Soohaeng | - |
dc.contributor.author | Yang, Woo-Young | - |
dc.contributor.author | Li, Xiang-Shu | - |
dc.contributor.author | Moon, Jung-Hwan | - |
dc.contributor.author | Lee, Kyung-Jin | - |
dc.contributor.author | Kim, Kinam | - |
dc.date.accessioned | 2021-09-07T09:40:30Z | - |
dc.date.available | 2021-09-07T09:40:30Z | - |
dc.date.created | 2021-06-19 | - |
dc.date.issued | 2011-08-02 | - |
dc.identifier.issn | 0935-9648 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/111814 | - |
dc.description.abstract | Solid electrolyte memories utilizing voltage-induced resistance change display the capability of multilevel switching, but understanding of the microscopic switching mechanism still is incomplete. Here, in situ TEM observations of voltage-induced changes in the microstructure of a solid electrolyte memory are reported, revealing that the multilevel switching originates from the growth of multiple conducting filaments with nanometer-sized diameter and spacing. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.subject | RESISTANCE WINDOW | - |
dc.subject | DEVICE | - |
dc.subject | FILMS | - |
dc.title | In Situ Observation of Voltage-Induced Multilevel Resistive Switching in Solid Electrolyte Memory | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Kyung-Jin | - |
dc.identifier.doi | 10.1002/adma.201100507 | - |
dc.identifier.scopusid | 2-s2.0-79960900595 | - |
dc.identifier.wosid | 000294410000007 | - |
dc.identifier.bibliographicCitation | ADVANCED MATERIALS, v.23, no.29, pp.3272 - + | - |
dc.relation.isPartOf | ADVANCED MATERIALS | - |
dc.citation.title | ADVANCED MATERIALS | - |
dc.citation.volume | 23 | - |
dc.citation.number | 29 | - |
dc.citation.startPage | 3272 | - |
dc.citation.endPage | + | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | RESISTANCE WINDOW | - |
dc.subject.keywordPlus | DEVICE | - |
dc.subject.keywordPlus | FILMS | - |
dc.subject.keywordAuthor | filament model | - |
dc.subject.keywordAuthor | mutlilevel resistance state | - |
dc.subject.keywordAuthor | RE-RAM | - |
dc.subject.keywordAuthor | resistive switching effect | - |
dc.subject.keywordAuthor | solid electrolyte resistive switching memory | - |
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