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Enhanced performance of solar cells with anti-reflection layer fabricated by nano-imprint lithography

Authors
Han, Kang-SooShin, Ju-HyeonYoon, Woo-YoungLee, Heon
Issue Date
1월-2011
Publisher
ELSEVIER
Keywords
Nano-imprint lithography; Moth-eye; GaAs solar cell; Anti-reflection; Conversion efficiency
Citation
SOLAR ENERGY MATERIALS AND SOLAR CELLS, v.95, no.1, pp.288 - 291
Indexed
SCIE
SCOPUS
Journal Title
SOLAR ENERGY MATERIALS AND SOLAR CELLS
Volume
95
Number
1
Start Page
288
End Page
291
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/113431
DOI
10.1016/j.solmat.2010.04.064
ISSN
0927-0248
Abstract
Because of increase in demand for clean energy sources, photovoltaic device is becoming more important as a new power plant. To replace fossil fuels with photovoltaics, generating electricity with solar cells should meet cost effectiveness and high efficiency. An anti-reflection technique is one of the effective methods to achieve high efficiency. To reduce the reflection at the surface of concentrated photovoltaic device, a nanometer scale dot-pattern array was formed on the surface of GaInP/Ga(In)As/Ge solar cells by nano-imprint lithography. Since this nano-pattern is smaller than the wavelength of visible light, the effective refractive index near the surface changes gradually. Thus, the reflection of the light at the surface with moth-eye structure can be effectively reduced for overall spectral region. As a result, a solar cell with the moth-eye pattern as an anti-reflection layer showed lower reflectance and enhanced total conversion efficiency, compared to a solar cell without a moth-eye patterned layer. The patterned solar cell was characterized using UV-vis spectrophotometer, atomic force microscope (AFM) and scanning electron microscope (SEM), and its total conversion efficiency was measured by solar simulator. (C) 2010 Elsevier B.V. All rights reserved.
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