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Guest Editorial: Special Issue on Pattern Recognition in Neuroimaging

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dc.contributor.authorLee, Seong-Whan-
dc.date.accessioned2021-09-07T21:50:30Z-
dc.date.available2021-09-07T21:50:30Z-
dc.date.created2021-06-14-
dc.date.issued2011-
dc.identifier.issn0899-9457-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/115012-
dc.languageEnglish-
dc.language.isoen-
dc.publisherWILEY-BLACKWELL-
dc.titleGuest Editorial: Special Issue on Pattern Recognition in Neuroimaging-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Seong-Whan-
dc.identifier.doi10.1002/ima.20289-
dc.identifier.scopusid2-s2.0-79955880714-
dc.identifier.wosid000291155100001-
dc.identifier.bibliographicCitationINTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY, v.21, no.2, pp.121 - 122-
dc.relation.isPartOfINTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY-
dc.citation.titleINTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY-
dc.citation.volume21-
dc.citation.number2-
dc.citation.startPage121-
dc.citation.endPage122-
dc.type.rimsART-
dc.type.docTypeEditorial Material-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaImaging Science & Photographic Technology-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryImaging Science & Photographic Technology-
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