Guest Editorial: Special Issue on Pattern Recognition in Neuroimaging
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Seong-Whan | - |
dc.date.accessioned | 2021-09-07T21:50:30Z | - |
dc.date.available | 2021-09-07T21:50:30Z | - |
dc.date.created | 2021-06-14 | - |
dc.date.issued | 2011 | - |
dc.identifier.issn | 0899-9457 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/115012 | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | WILEY-BLACKWELL | - |
dc.title | Guest Editorial: Special Issue on Pattern Recognition in Neuroimaging | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lee, Seong-Whan | - |
dc.identifier.doi | 10.1002/ima.20289 | - |
dc.identifier.scopusid | 2-s2.0-79955880714 | - |
dc.identifier.wosid | 000291155100001 | - |
dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY, v.21, no.2, pp.121 - 122 | - |
dc.relation.isPartOf | INTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY | - |
dc.citation.title | INTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY | - |
dc.citation.volume | 21 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 121 | - |
dc.citation.endPage | 122 | - |
dc.type.rims | ART | - |
dc.type.docType | Editorial Material | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Imaging Science & Photographic Technology | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Imaging Science & Photographic Technology | - |
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