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Guest Editorial: Special Issue on Pattern Recognition in Neuroimaging

Authors
Lee, Seong-Whan
Issue Date
2011
Publisher
WILEY-BLACKWELL
Citation
INTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY, v.21, no.2, pp.121 - 122
Indexed
SCIE
SCOPUS
Journal Title
INTERNATIONAL JOURNAL OF IMAGING SYSTEMS AND TECHNOLOGY
Volume
21
Number
2
Start Page
121
End Page
122
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/115012
DOI
10.1002/ima.20289
ISSN
0899-9457
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