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Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic
- Authors
- Bae, Jinsoo; Park, Seong Ill; Kim, Yun Hee; Yoon, Seokho; Oh, Jongho; Song, Iickho; Oh, Seong-Jun
- Issue Date
- Nov-2010
- Publisher
- IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
- Keywords
- asymptotic sample number; locally optimum detector; minimum false alarm; sequential test; sequential probability ratio test
- Citation
- IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, v.E93A, no.11, pp.2045 - 2056
- Indexed
- SCIE
SCOPUS
- Volume
- E93A
- Number
- 11
- Start Page
- 2045
- End Page
- 2056
- ISSN
- 1745-1337
- Abstract
- Based on the characteristics of the thresholds of two detection schemes employing locally optimum test statistics a sequential detection design procedure is proposed and analyzed The proposed sequential test called the sequential locally optimum test (SLOT) inherently provides finite stopping time (terminates with probability one within the finite horizon) and thereby avoids undesirable forced termination The performance of the SLOT is compared with that of the fixed sample size test sequential probability ratio test (SPRT) truncated SPRT and 2 SPRT It is observed that the SLOT requires smaller average sample numbers than other schemes at most values of the normalized signal amplitude while maintaining the error performance close to the SPRT
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Related Researcher
- Oh, Seong Jun
- Department of Information Security