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Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

Authors
Bae, JinsooPark, Seong IllKim, Yun HeeYoon, SeokhoOh, JonghoSong, IickhoOh, Seong-Jun
Issue Date
Nov-2010
Publisher
IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
Keywords
asymptotic sample number; locally optimum detector; minimum false alarm; sequential test; sequential probability ratio test
Citation
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, v.E93A, no.11, pp.2045 - 2056
Indexed
SCIE
SCOPUS
Journal Title
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES
Volume
E93A
Number
11
Start Page
2045
End Page
2056
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/115407
DOI
10.1587/transfun.E93.A.2045
ISSN
1745-1337
Abstract
Based on the characteristics of the thresholds of two detection schemes employing locally optimum test statistics a sequential detection design procedure is proposed and analyzed The proposed sequential test called the sequential locally optimum test (SLOT) inherently provides finite stopping time (terminates with probability one within the finite horizon) and thereby avoids undesirable forced termination The performance of the SLOT is compared with that of the fixed sample size test sequential probability ratio test (SPRT) truncated SPRT and 2 SPRT It is observed that the SLOT requires smaller average sample numbers than other schemes at most values of the normalized signal amplitude while maintaining the error performance close to the SPRT
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