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Diffusion induced grain-boundary migration in SrO-doped CeO2 electrolyte and its effect on electrical properties
- Authors
- Cho, Pyeong-Seok; Park, Seung-Young; Kim, Jeong-Joo; Do, Hyoung-Seok; Park, Hyun-Min; Lee, Jong-Heun
- Issue Date
- 7-10월-2010
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- Diffusion induced grain-boundary migration; SrO-doped CeO2; Complex Impedance Spectroscopy; Grain-boundary conduction
- Citation
- SOLID STATE IONICS, v.181, no.31-32, pp.1420 - 1424
- Indexed
- SCIE
SCOPUS
- Journal Title
- SOLID STATE IONICS
- Volume
- 181
- Number
- 31-32
- Start Page
- 1420
- End Page
- 1424
- ISSN
- 0167-2738
- Abstract
- Diffusion induced grain-boundary migration (DIGM) was observed when 4 and 9 mol% SrO-doped CeO2 (SrDC) ceramics were heat-treated at 1300 degrees C after sintering at 1600 degrees C. In the 9 mol% SrDC specimen, the curvature and distance of boundary migration were increased significantly as the heat-treatment time was increased from 10 min to 10 h at 1300 degrees C. This induced a -2.9-fold increase of the apparent grain-boundary resistivity, which was explained by the physico-chemical change of the grain-boundary structure and/or the current constriction effect due to the undulated boundary morphology. (C) 2010 Elsevier B.V. All rights reserved.
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