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Temperature-Adaptive Back-Bias Voltage Generator for an RCAT Pseudo SRAM

Authors
Son, Jong-PilByun, Hyun-GeunJun, Young-HyunKim, KinamKim, Soo-Won
Issue Date
Jun-2010
Publisher
WILEY
Keywords
Back-bias voltage generator; Memories; Pseudo SRAM; RCAT; Temperature
Citation
ETRI JOURNAL, v.32, no.3, pp.406 - 413
Indexed
SCIE
SCOPUS
KCI
Journal Title
ETRI JOURNAL
Volume
32
Number
3
Start Page
406
End Page
413
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/116381
DOI
10.4218/etrij.10.0109.0366
ISSN
1225-6463
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College of Engineering > School of Electrical Engineering > 1. Journal Articles

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