Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chung, Jaehun | - |
dc.contributor.author | Kim, Kyeongtae | - |
dc.contributor.author | Hwang, Gwangseok | - |
dc.contributor.author | Kwon, Ohmyoung | - |
dc.contributor.author | Lee, Joon Sik | - |
dc.contributor.author | Park, Seung Ho | - |
dc.contributor.author | Choi, Young Ki | - |
dc.date.accessioned | 2021-09-08T03:32:35Z | - |
dc.date.available | 2021-09-08T03:32:35Z | - |
dc.date.created | 2021-06-11 | - |
dc.date.issued | 2010-05 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/116545 | - |
dc.description.abstract | The need for a subsurface imaging technique to locate and characterize subsurface defects in multidimensional micro- and nanoengineered devices has been growing rapidly. We show that a subsurface heater can be located accurately using the phase lag of a thermal wave. We deduce that the absolute phase lag is composed of four components. Among the four components, we isolate the component directly related to the position and the structure of the periodic heat source. We demonstrate that the position of the heater can be estimated accurately from the isolated phase lag component. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3422245] | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | MICROSCOPY | - |
dc.subject | HOLOGRAPHY | - |
dc.subject | MECHANISMS | - |
dc.title | Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kwon, Ohmyoung | - |
dc.identifier.doi | 10.1063/1.3422245 | - |
dc.identifier.scopusid | 2-s2.0-77952966003 | - |
dc.identifier.wosid | 000278183300023 | - |
dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.81, no.5 | - |
dc.relation.isPartOf | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.volume | 81 | - |
dc.citation.number | 5 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | MICROSCOPY | - |
dc.subject.keywordPlus | HOLOGRAPHY | - |
dc.subject.keywordPlus | MECHANISMS | - |
dc.subject.keywordAuthor | distance measurement | - |
dc.subject.keywordAuthor | nondestructive testing | - |
dc.subject.keywordAuthor | photothermal effects | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(02841) 서울특별시 성북구 안암로 14502-3290-1114
COPYRIGHT © 2021 Korea University. All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.