Percolation threshold related to field-effect transistors using thin multi-walled carbon nanotubes composites
- Authors
- Bae, Sang Won; Kim, Kihyun; Han, Yoon Deok; Kim, Sung Hwan; Joo, Jinsoo; Choi, Ji Hoon; Lee, Cheol Jin
- Issue Date
- 10월-2009
- Publisher
- ELSEVIER SCIENCE SA
- Keywords
- Thin multi-walled carbon nanotubes; Carbon nanotubes composite; Field-effect transistor; Percolation threshold; Conductivity
- Citation
- SYNTHETIC METALS, v.159, no.19-20, pp.2034 - 2037
- Indexed
- SCIE
SCOPUS
- Journal Title
- SYNTHETIC METALS
- Volume
- 159
- Number
- 19-20
- Start Page
- 2034
- End Page
- 2037
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/119166
- DOI
- 10.1016/j.synthmet.2009.07.017
- ISSN
- 0379-6779
- Abstract
- We fabricated thin-film field-effect transistors (TF-FETs) using thin multi-walled carbon nanotubes (t-MWCNTs) and poly (methyl methacrylate) (PMMA) composites as the active layer. The gate-dependent current-voltage characteristics, the current on/off ratio (I-on/off), and the dc conductivity (sigma(dc)) were measured as a function of various weight (wt.%) of t-MWCNTs. The typical p-type FET characteristics were observed. We found that the field-effect I-on/off increased rapidly for TF-FETs with a wt.% of t-MWCNTs below 0.6. For the TF-FETs with a wt.% of t-MWCNT above 0.6, the I-on/off was relatively low. From the measured sigma(dc) as a function of the wt.% of t-MWCNTs, the percolation threshold (p(c)) was observed to be approximately 0.6 wt.% for the t-MWCNT composites. We infer that the TF-FET characteristics are closely related to the p(c) for the charge conduction of the t-MWCNTs composites. (C) 2009 Elsevier B.V. All rights reserved.
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Collections - College of Science > Department of Physics > 1. Journal Articles
- College of Engineering > School of Electrical Engineering > 1. Journal Articles
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