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Improved electrical and thermal properties of Ag contacts for GaN-based flip-chip light-emitting diodes by using a NiZn alloy capping layer

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dc.contributor.authorJung, Se-Yeon-
dc.contributor.authorKim, Yoon-Han-
dc.contributor.authorKong, Young Shik-
dc.contributor.authorSeong, Tae-Yeon-
dc.date.accessioned2021-09-08T12:49:53Z-
dc.date.available2021-09-08T12:49:53Z-
dc.date.created2021-06-11-
dc.date.issued2009-10-
dc.identifier.issn0749-6036-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/119168-
dc.description.abstractWe investigate the effect of a 100 nm-thick NiZn alloy (10 wt% Zn) capping layer on the thermal and electrical properties of Ag reflectors (200 nm) for flip-chip light-emitting diodes (LEDs). It is shown that the introduction of the NiZn capping layer minimizes the formation of interfacial voids and surface agglomeration. Furthermore, LEDs fabricated with the NiZn-capping-layer-combined contacts produce better output power as compared to those with the Ag only reflectors. For example, the LEDs with the 400 degrees C-annealed Ag/NiZn contacts give higher output power by similar to 36% than those with the 400 degrees C-annealed Ag only contacts. X-ray photoemission spectroscopy and Auger electron spectroscopy measurements are performed to understand the improved electrical properties of the LEDs fabricated with the NiZn-capping-layer-combined Ag contacts. (C) 2009 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD-
dc.subjectP-TYPE GAN-
dc.subjectOHMIC CONTACTS-
dc.subjectLOW-RESISTANCE-
dc.subjectLEDS-
dc.titleImproved electrical and thermal properties of Ag contacts for GaN-based flip-chip light-emitting diodes by using a NiZn alloy capping layer-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1016/j.spmi.2009.04.007-
dc.identifier.scopusid2-s2.0-70249086189-
dc.identifier.wosid000271339900006-
dc.identifier.bibliographicCitationSUPERLATTICES AND MICROSTRUCTURES, v.46, no.4, pp.578 - 584-
dc.relation.isPartOfSUPERLATTICES AND MICROSTRUCTURES-
dc.citation.titleSUPERLATTICES AND MICROSTRUCTURES-
dc.citation.volume46-
dc.citation.number4-
dc.citation.startPage578-
dc.citation.endPage584-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusP-TYPE GAN-
dc.subject.keywordPlusOHMIC CONTACTS-
dc.subject.keywordPlusLOW-RESISTANCE-
dc.subject.keywordPlusLEDS-
dc.subject.keywordAuthorLED-
dc.subject.keywordAuthorp-type Ohmic contact-
dc.subject.keywordAuthorAg reflector-
dc.subject.keywordAuthorNiZn capping layer-
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공과대학 (신소재공학부)
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