A Good Puncturing Scheme for Rate Compatible Low-Density Parity-Check Codes
- Authors
- Choi, Sunghoon; Yoon, Sungroh; Sung, Wonjin; Kwon, Hongkyu; Heo, Jun
- Issue Date
- 10월-2009
- Publisher
- KOREAN INST COMMUNICATIONS SCIENCES (K I C S)
- Keywords
- block-type LDPC codes (B-LDPC); density evolution (DE); low-density parity-check code (LDPC) codes; puncturing
- Citation
- JOURNAL OF COMMUNICATIONS AND NETWORKS, v.11, no.5, pp.455 - 463
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF COMMUNICATIONS AND NETWORKS
- Volume
- 11
- Number
- 5
- Start Page
- 455
- End Page
- 463
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/119181
- DOI
- 10.1109/JCN.2009.6388389
- ISSN
- 1229-2370
- Abstract
- We consider the challenges of finding good puncturing patterns for rate-compatible low-density parity-check code (LDPC) codes over additive white Gaussian noise (AWGN) channels. Puncturing is a scheme to obtain a series of higher rate codes from a lower rate mother code. It is widely used in channel coding but it causes performance is lost compared to non-punctured LDPC codes at the same rate. Previous work, considered the role of survived check nodes in puncturing patterns. Limitations, such as single survived check node assumption and simulation-based verification, were examined. This paper analyzes the performance according to the role of multiple survived check nodes and multiple dead check nodes. Based on these analyses, we propose new algorithm to find a good puncturing pattern for LDPC codes over AWGN channels.
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Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
- College of Engineering > School of Electrical Engineering > 1. Journal Articles
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