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Effect of a hydrogen ratio in electrical and optical properties of hydrogenated Al-doped ZnO films

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dc.contributor.authorTark, S. J.-
dc.contributor.authorOk, Y. -W.-
dc.contributor.authorKang, M. G.-
dc.contributor.authorLim, H. J.-
dc.contributor.authorKim, W. M.-
dc.contributor.authorKim, D.-
dc.date.accessioned2021-09-08T13:07:16Z-
dc.date.available2021-09-08T13:07:16Z-
dc.date.created2021-06-11-
dc.date.issued2009-10-
dc.identifier.issn1385-3449-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/119235-
dc.description.abstractThis study examined the effect of the hydrogen ratio on the electrical and optical properties of hydrogenated Al-doped zinc oxide (AZO) thin films deposited by rf magnetron sputtering using a ceramic target (98 wt% ZnO, 2 wt% Al2O3). Various AZO films on glass were prepared by changing the H-2/(Ar + H-2) ratio at room temperature. The AZO/H films showed a lower resistivity and a higher carrier concentration and mobility than the AZO films. However, the resistivity and mobility of the AZO/H films increased and decreased with increasing H-2 flow ratio, respectively. As a result, the AZO/H films grown with 2% H-2 addition showed excellent electrical properties with a resistivity of 4.98 x 10(4) Omega cm. The UV-measurements showed that the optical transmission of the AZO/H films was > 85% in the visible range with a wide optical band gap. In addition, the effect of H-2 flow ratio on the structure and composition of hydrogenated AZO thin films have also been studied.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherSPRINGER-
dc.subjectTIN-OXIDE-FILMS-
dc.subjectTHIN-FILMS-
dc.subjectZINC-OXIDE-
dc.subjectCONDUCTIVITY-
dc.subjectDEPOSITION-
dc.subjectSUBSTRATE-
dc.subjectGROWTH-
dc.titleEffect of a hydrogen ratio in electrical and optical properties of hydrogenated Al-doped ZnO films-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, D.-
dc.identifier.doi10.1007/s10832-008-9532-0-
dc.identifier.scopusid2-s2.0-73449144799-
dc.identifier.wosid000271982300085-
dc.identifier.bibliographicCitationJOURNAL OF ELECTROCERAMICS, v.23, no.2-4, pp.548 - 553-
dc.relation.isPartOfJOURNAL OF ELECTROCERAMICS-
dc.citation.titleJOURNAL OF ELECTROCERAMICS-
dc.citation.volume23-
dc.citation.number2-4-
dc.citation.startPage548-
dc.citation.endPage553-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.subject.keywordPlusTIN-OXIDE-FILMS-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusZINC-OXIDE-
dc.subject.keywordPlusCONDUCTIVITY-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusSUBSTRATE-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordAuthorZnO-
dc.subject.keywordAuthorAl doping-
dc.subject.keywordAuthorHydrogenated-
dc.subject.keywordAuthorrf magnetron sputtering-
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