Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Metal Patterning Process on Rigid and Flexible Substrates Using Nanoimprint Lithography and Resist Pattern Transfer Technique

Authors
Jung, Ho YongHan, Kang-SooLee, Jong HwaLee, Heon
Issue Date
7월-2009
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
UV Nanoimprint Lithography (UV-NIL); Resist Pattern Transfer; UV Curable Adhesive; Lift-Off Process; Rabbit Ear Shaped Defect
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.9, no.7, pp.4338 - 4341
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
9
Number
7
Start Page
4338
End Page
4341
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/119795
DOI
10.1166/jnn.2009.M56
ISSN
1533-4880
Abstract
Fabrication of high aspect ratio metal patterns without rabbit ear shaped defects on rigid Si and flexible polyethylene terephthalate (PET) substrates was demonstrated. This process is composed of UV nanoimprint lithography (UV-NIL), resist pattern transfer step, and lift-off process. The imprinted resist pattern with a positive pattern profile on a water soluble polyvinyl alcohol (PVA) coated transparent substrate was transferred to Si and PET substrates in order to create an undercut profile for the high fidelity lift-off process using an UV curable adhesive. After the pattern transfer step, the PVA coated substrate was released by water soaking. The adhesive residue on the substrate was removed by short O-2 reactive ion etching (RIE) without significant change of the resist pattern profile. Subsequently, the metal film was deposited by e-beam evaporation on the sample and the resist pattern was removed by acetone solution. As a result, the metal patterns with 250 nm of linewidth and 80 nm of thickness were formed by this process on Si and flexible PET substrates without rabbit ear shaped defects.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Heon photo

Lee, Heon
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE