Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing
DC Field | Value | Language |
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dc.contributor.author | Yaqoob, Zahid | - |
dc.contributor.author | Choi, Wonshik | - |
dc.contributor.author | Oh, Seungeun | - |
dc.contributor.author | Lue, Niyom | - |
dc.contributor.author | Park, Yongkeun | - |
dc.contributor.author | Fang-Yen, Christopher | - |
dc.contributor.author | Dasari, Ramachandra R. | - |
dc.contributor.author | Badizadegan, Kamran | - |
dc.contributor.author | Feld, Michael S. | - |
dc.date.accessioned | 2021-09-08T16:08:55Z | - |
dc.date.available | 2021-09-08T16:08:55Z | - |
dc.date.created | 2021-06-10 | - |
dc.date.issued | 2009-06-22 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/119812 | - |
dc.description.abstract | We report a quantitative phase microscope based on spectral domain optical coherence tomography and line-field illumination. The line illumination allows self phase-referencing method to reject common-mode phase noise. The quantitative phase microscope also features a separate reference arm, permitting the use of high numerical aperture (NA > 1) microscope objectives for high resolution phase measurement at multiple points along the line of illumination. We demonstrate that the path-length sensitivity of the instrument can be as good as 41 pm / root Hz, which makes it suitable for nanometer scale study of cell motility. We present the detection of natural motions of cell surface and two-dimensional surface profiling of a HeLa cell. (C) 2009 Optical Society of America | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.subject | OPTICAL COHERENCE TOMOGRAPHY | - |
dc.subject | DYNAMICS | - |
dc.subject | INTERFEROMETRY | - |
dc.title | Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Choi, Wonshik | - |
dc.identifier.doi | 10.1364/OE.17.010681 | - |
dc.identifier.scopusid | 2-s2.0-67649261936 | - |
dc.identifier.wosid | 000267761100025 | - |
dc.identifier.bibliographicCitation | OPTICS EXPRESS, v.17, no.13, pp.10681 - 10687 | - |
dc.relation.isPartOf | OPTICS EXPRESS | - |
dc.citation.title | OPTICS EXPRESS | - |
dc.citation.volume | 17 | - |
dc.citation.number | 13 | - |
dc.citation.startPage | 10681 | - |
dc.citation.endPage | 10687 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.subject.keywordPlus | OPTICAL COHERENCE TOMOGRAPHY | - |
dc.subject.keywordPlus | DYNAMICS | - |
dc.subject.keywordPlus | INTERFEROMETRY | - |
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