Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Dependency of Critical Behaviors on Different Order Parameters for Antiferromagnetic Heisenberg Model on Three-Dimensional Regular Lattice

Authors
Yang, Jae-SukYeon, Kyu-HwangYu, Seong ChoKwak, Wooseop
Issue Date
6월-2009
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Antiferromagnetization; Heisenberg model; Monte Carlo simulation; order parameter
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.45, no.6, pp.2651 - 2654
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON MAGNETICS
Volume
45
Number
6
Start Page
2651
End Page
2654
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/119861
DOI
10.1109/TMAG.2009.2018947
ISSN
0018-9464
Abstract
Magnetization is measured in experiments for both ferromagnetic and antiferromagnetic materials to investigate the magnetic properties of materials, and the susceptibility of total magnetization as a function of external field is used to determine Neel or Cued temperatures. In the Monte Carlo simulation, it is important to define the proper order parameters to describe the spin model, where the magnetization is used as an order parameter for ferromagnetic spin model and the staggered magnetization is used as an order parameter for the antiferromagnetic spin model without geometrical frustration. However, it is difficult to define an order parameter for frustrated spin models. We perform the Monte Carlo simulation for the antiferromagnetic Heisenberg spin model using the damage spreading as an order parameter, and also perform simulation using both the magnetization and the staggered magnetization as order parameters. Then, we measure the critical temperatures and the critical exponents on three-dimensional regular lattice estimated by different order parameters, and then study the dependency of critical behaviors on different order parameters for the antiferromagnetic Heisenberg spin models.
Files in This Item
There are no files associated with this item.
Appears in
Collections
ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE