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ZnO nanowire field-effect transistor as a UV photodetector; optimization for maximum sensitivity

Authors
Kim, WoongChu, Kyo Seon
Issue Date
1월-2009
Publisher
WILEY-V C H VERLAG GMBH
Citation
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.206, no.1, pp.179 - 182
Indexed
SCIE
SCOPUS
Journal Title
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
Volume
206
Number
1
Start Page
179
End Page
182
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/120840
DOI
10.1002/pssa.200824338
ISSN
1862-6300
Abstract
We demonstrate that drain-source (V(ds)) and gate-source voltages (V(gs)) of a zinc oxide nanowire (ZnO NW) field-effect transistor (FET) can be optimized to increase UV photodetection sensitivity. Investigation of the relationship between the sensitivity and the applied voltages reveals that the photodetector is most sensitive when it operates (1) with highest on/off current ratio and (2) at the "bottom" of the subthreshold swing region. Our results can be broadly applied to maximize sensitivity of other FET-based sensors and detectors. A ZnO NW photodetector is most sensitive when V(gs) is positioned at the "bottom" of the subthreshold swing region.0 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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