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Nb SQUID가 탑재된 초고감도 캔티레버 제작Fabrication of Nb SQUID on an Ultra-sensitive Cantilever

Other Titles
Fabrication of Nb SQUID on an Ultra-sensitive Cantilever
Authors
김윤원이순걸최재혁
Issue Date
2009
Publisher
한국초전도학회
Keywords
Nb; Thin film; Superconductor; SQUID; Ultra sensitive; Cantilever
Citation
Progress in Superconductivity, v.11, no.1, pp.36 - 41
Indexed
KCI
OTHER
Journal Title
Progress in Superconductivity
Volume
11
Number
1
Start Page
36
End Page
41
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/121794
ISSN
1229-4764
Abstract
Superconducting quantum phenomena are getting attention from the field of metrology area. Following its first successful application of Josephson effect to voltage standard, piconewton force standard was suggested as a candidate for the next application of superconducting quantum effects in metrology. It is predicted that a micron-sized superconducting Nb ring in a strong magnetic field gradient generates a quantized force of the order of sub-piconewtons. In this work, we studied the design and fabrication of Nb superconducting quantum interference device (SQUID) on an ultra-thin silicon cantilever. The Nb SQUID and electrodes were structured on a silicon-on-insulator (SOI) wafer by dc magnetron sputtering and lift-off lithography. Using the resulting SOI wafer, we fabricated V-shaped and parallel-beam cantilevers, each with a 30-㎛-wide paddle; the length, width, and thickness of each cantilever arm were typically 440 ㎛, 4.5 ㎛, and 0.34 ㎛, respectively. However, the cantilevers underwent bending, a technical difficulty commonly encountered during the fabrication of electrical circuits on ultra-soft mechanical substrates. In order to circumvent this difficulty, we controlled the Ar pressure during Nb sputtering to minimize the intrinsic stress in the Nb film and studied the effect of residual stress on the resultant device.
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College of Science and Technology > Semiconductor Physics in Division of Display and Semiconductor Physics > 1. Journal Articles

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