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Synthesis and Microwave Dielectric Properties of Bi-4(SiO4)(3) Ceramics

Authors
Kim, Jin-SeongJoung, Mi-RiSong, Myung-EunNahm, SahnPaik, Jong-HooChoi, Byling-HyunYoo, Soon-Jae
Issue Date
Oct-2008
Publisher
WILEY
Citation
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.91, no.10, pp 3461 - 3464
Pages
4
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
Volume
91
Number
10
Start Page
3461
End Page
3464
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/122643
DOI
10.1111/j.1551-2916.2008.02657.x
ISSN
0002-7820
1551-2916
Abstract
Bi-4(SiO4)(3) ceramics were synthesized and their microwave dielectric properties were investigated. The Bi12SiO20 second phase was formed at approximately 400 degrees C, while the Bi2O2SiO3 and Bi-4(SiO4)(3) phases started to form at 600 degrees C. The amount of the Bi12SiO20, and Bi2O2SiO3 second phases decreased as the firing, temperature exceeded 650 degrees C. A homogeneous Bi-4(SiO4)(3) phase is-as obtained for the specimen fired at 850 degrees C. For the specimens sintered at 900 degrees C for more than 5 h, high-density Bi-4(SiO4)(3) ceramics were obtained. In particular, the Bi-4(SiO4)(3) ceramics sintered at 900 degrees C for 8 h exhibited the good microwave dielectric properties of epsilon(r) = 14.9, Q x f = 36 101 GHz and tau(f) = -9.42 ppm/degrees C.
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