Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Quality factor measurement of micro gyroscope structure according to vacuum level and desired Q-factor range package method

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Jong-Seok-
dc.contributor.authorLee, Sang-Woo-
dc.contributor.authorJung, Kyu-Dong-
dc.contributor.authorKim, Woon-Bae-
dc.contributor.authorChoa, Sung-Hoon-
dc.contributor.authorJu, Byeong-Kwon-
dc.date.accessioned2021-09-09T07:47:57Z-
dc.date.available2021-09-09T07:47:57Z-
dc.date.created2021-06-10-
dc.date.issued2008-06-
dc.identifier.issn0026-2714-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/123436-
dc.description.abstractA micro-machined gyro chip of gyroscope is normally packaged in specific vacuum level to get the specific quality factor(Q-factor). if the Q-factor is too high, frequency tuning and the approximate matching between driving and sensing comb structure become difficult, and if the Q-factor is too low, its sensitivity decreases. The optimum Q-factor of our gyro chip design is 4000 range. To get this range, we measured the drive mode Q-factor as vacuum level of our gyro chip and we found that the vacuum level of the desired Q-factor 4000 is in the range of 740 mTorr. Based on this data, we fabricate the wafer level package gyro chip of the desired Q-factor by controlled the basic pressure of package bonding chamber just prior to the bonding process. After wafer level package process, we measured Q-factor of whole samples. Among 804 samples, 502 packaged gyro chips are worked and the Q-factor of 67% samples is between 3500 and 4500 range. (c) 2008 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.titleQuality factor measurement of micro gyroscope structure according to vacuum level and desired Q-factor range package method-
dc.typeArticle-
dc.contributor.affiliatedAuthorJu, Byeong-Kwon-
dc.identifier.doi10.1016/j.microrel.2008.03.001-
dc.identifier.scopusid2-s2.0-45849146963-
dc.identifier.wosid000258049700024-
dc.identifier.bibliographicCitationMICROELECTRONICS RELIABILITY, v.48, no.6, pp.948 - 952-
dc.relation.isPartOfMICROELECTRONICS RELIABILITY-
dc.citation.titleMICROELECTRONICS RELIABILITY-
dc.citation.volume48-
dc.citation.number6-
dc.citation.startPage948-
dc.citation.endPage952-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordAuthorRF-MEMS-
dc.subject.keywordAuthorGyroscope-
dc.subject.keywordAuthorQuality factor-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Ju, Byeong kwon photo

Ju, Byeong kwon
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE