Operation of single transistor type ferroelectric random access memory
- Authors
- Shim, SI; Kim, S; Kim, YT; Park, JH
- Issue Date
- 28-10월-2004
- Publisher
- INST ENGINEERING TECHNOLOGY-IET
- Keywords
- CAPACITORS
- Citation
- ELECTRONICS LETTERS, v.40, no.22, pp.1397 - 1398
- Indexed
- SCIE
SCOPUS
- Journal Title
- ELECTRONICS LETTERS
- Volume
- 40
- Number
- 22
- Start Page
- 1397
- End Page
- 1398
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/123594
- DOI
- 10.1049/el:20046555
- ISSN
- 0013-5194
- Abstract
- Verification was sought for the memory operation of a single transistor type ferroelectric random access memory (IT type FeRAM) with a circuit model for a memory cell transistor combined with a precharged capacitive decoupling sensing scheme. The wiring scheme of the IT type FeRAM array was also proposed based on the operation of the fabricated memory cell transistor. As a result, the memory operation of IT type FeRAM was confirmed at a low current level with high sensing speed and no reference cell, and the design and verification of the full chip were achieved.
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