Electrical properties and X-ray spectrum of semi-insulating CdZnTe : Pb crystals
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Won, J. H. | - |
dc.contributor.author | Kim, K. H. | - |
dc.contributor.author | Cho, S. H. | - |
dc.contributor.author | Suh, J. H. | - |
dc.contributor.author | Hong, J. K. | - |
dc.contributor.author | Kim, S. U. | - |
dc.date.accessioned | 2021-09-09T11:06:32Z | - |
dc.date.available | 2021-09-09T11:06:32Z | - |
dc.date.created | 2021-06-10 | - |
dc.date.issued | 2008-02-21 | - |
dc.identifier.issn | 0168-9002 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/124065 | - |
dc.description.abstract | High purity Pb-doped CdZnTe single crystals were grown by using the vertical Bridgman method. Their electrical properties and X-ray spectrum were investigated. The doping concentration of Pb was about 1 x 10(19) cm(-3). The resistivity of Pb-doped CdZnTe single crystal was 2 x 10(9) Omega cm. The temperature dependence of the resistivity of these crystals was examined between the region of 200 and 300 K. The plot of log(p) versus 1000/T was represented by a straight line with a slope of 380 meV. From the PL spectrum, we have confirmed that type conversion from p to n-type conductivity originated from the compensation process of Cd vacancies, which are the most abundant acceptors in CdZnTe. Also, the effects of Pb-doping on the mobility and X-ray spectra were studied by time-of-flight (TOF) and Am-241 spectrum measurements. (C) 2008 Published by Elsevier B.V. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | CDTE | - |
dc.subject | DEFECTS | - |
dc.title | Electrical properties and X-ray spectrum of semi-insulating CdZnTe : Pb crystals | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, K. H. | - |
dc.contributor.affiliatedAuthor | Hong, J. K. | - |
dc.identifier.doi | 10.1016/j.nima.2007.11.074 | - |
dc.identifier.scopusid | 2-s2.0-39049130089 | - |
dc.identifier.wosid | 000253613300011 | - |
dc.identifier.bibliographicCitation | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.586, no.2, pp.211 - 214 | - |
dc.relation.isPartOf | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
dc.citation.title | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
dc.citation.volume | 586 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 211 | - |
dc.citation.endPage | 214 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Nuclear Science & Technology | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Physics, Nuclear | - |
dc.relation.journalWebOfScienceCategory | Physics, Particles & Fields | - |
dc.subject.keywordPlus | CDTE | - |
dc.subject.keywordPlus | DEFECTS | - |
dc.subject.keywordAuthor | CdZnTe : Pb | - |
dc.subject.keywordAuthor | X-ray detector | - |
dc.subject.keywordAuthor | X-ray spectrum | - |
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