Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Growth of ZnO thin film on p-GaN/sapphire (0001) by simple hydrothermal technique

Full metadata record
DC Field Value Language
dc.contributor.authorSahoo, Trilochan-
dc.contributor.authorKang, Eun-Sil-
dc.contributor.authorKim, Myoung-
dc.contributor.authorKannan, Vasudevan-
dc.contributor.authorYu, Yeon-Tae-
dc.contributor.authorShin, Dong-Chan-
dc.contributor.authorKim, Tae-Geun-
dc.contributor.authorLee, In-Hwan-
dc.date.accessioned2021-09-09T11:24:49Z-
dc.date.available2021-09-09T11:24:49Z-
dc.date.created2021-06-15-
dc.date.issued2008-02-01-
dc.identifier.issn0022-0248-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/124099-
dc.description.abstractZinc oxide (ZnO) heteroepitaxial thin films were successfully grown on p-GaN/sapphire (0001) by single-step hydrothermal route at a low temperature of 90 degrees C. Continuous ZnO thin films with c-axis orientation were grown in aqueous solution of zinc acetate di-hydrate and ammonium hydroxide. X-ray diffraction, scanning electron microscopy and room temperature photoluminescence were carried out for structural, morphological and optical property analysis. The as-grown ZnO films showed preferential growth along (0001) direction. The in-plane orientation between ZnO thin film and p-GaN buffer layer was found to be [11 (2) over bar0](ZnO)parallel to[11 (2) over bar0](GaN). Sharp luminescence peak centered at 377nm due to excitonic recombination from ZnO thin film was observed. (C) 2007 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER-
dc.subjectEPITAXIAL-GROWTH-
dc.subjectTEMPERATURE-
dc.subjectDEPOSITION-
dc.subjectMORPHOLOGY-
dc.subjectNANORODS-
dc.titleGrowth of ZnO thin film on p-GaN/sapphire (0001) by simple hydrothermal technique-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Tae-Geun-
dc.identifier.doi10.1016/j.jcrysgro.2007.11.026-
dc.identifier.scopusid2-s2.0-37849019011-
dc.identifier.wosid000253016900010-
dc.identifier.bibliographicCitationJOURNAL OF CRYSTAL GROWTH, v.310, no.3, pp.570 - 574-
dc.relation.isPartOfJOURNAL OF CRYSTAL GROWTH-
dc.citation.titleJOURNAL OF CRYSTAL GROWTH-
dc.citation.volume310-
dc.citation.number3-
dc.citation.startPage570-
dc.citation.endPage574-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaCrystallography-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryCrystallography-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusEPITAXIAL-GROWTH-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusMORPHOLOGY-
dc.subject.keywordPlusNANORODS-
dc.subject.keywordAuthorcrystal structure-
dc.subject.keywordAuthorX-ray diffraction-
dc.subject.keywordAuthorhydrothermal crystal growth-
dc.subject.keywordAuthorthin film-
dc.subject.keywordAuthorzinc compounds-
dc.subject.keywordAuthorsemiconducting II-VI materials-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Tae geun photo

Kim, Tae geun
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE