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Dual Damping EWMA를 이용한 효율적인 반도체 공정 제어에 관한 연구A Study of Semiconductor Process Control using Dual Damping EWMA
- Other Titles
- A Study of Semiconductor Process Control using Dual Damping EWMA
- Issue Date
- 2008
- Publisher
- 대한산업공학회
- Keywords
- semiconductor; FAB control; EWMA; control logic
- Citation
- 산업공학(IE interfaces), v.21, no.2, pp.141 - 150
- Indexed
- KCI
- Journal Title
- 산업공학(IE interfaces)
- Volume
- 21
- Number
- 2
- Start Page
- 141
- End Page
- 150
- ISSN
- 1225-0996
- Abstract
- In this paper, an efficient control method for semiconductor fabrication process is presented. Generally, control is performed with data which is under the influence of process disturbance. EWMA is one of the most popular control methods in semiconductor fabrication that effectively deals with varying process condition. A new method using EWMA, called the Dual Damping EWMA, is presented in this study to reduce over-control by separating weight factor of input and output. The goal is to reflect Drift but reduce the effects of White noise in run to run control. Simulation is performed to evaluate the performance of DPEWMA and to compare with EWMA and Double EWMA.
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