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금 나노 입자와 표면전하현미경을 이용한 알루미늄 이온의 고민감도 검출High sensitive detection of aluminum ions using gold nanoparticles and Kelvin Probe Force Microscope

Alternative Title
High sensitive detection of aluminum ions using gold nanoparticles and Kelvin Probe Force Microscope
Authors
PARK, Jinsung
Issue Date
19-4월-2019
Publisher
대한기계학회
Citation
대한기계학회 CAE 및 응용역학부문
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/13496
Conference Name
대한기계학회 CAE 및 응용역학부문
Place
KO
Conference Date
2019-04-18
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Graduate School > Department of Control and Instrumentation Engineering > 2. Conference Papers

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