FaceVAE: Generation of a 3D Geometric Object Using Variational Autoencoders
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Sungsoo | - |
dc.contributor.author | Kim, Hyeoncheol | - |
dc.date.accessioned | 2022-02-16T09:41:58Z | - |
dc.date.available | 2022-02-16T09:41:58Z | - |
dc.date.created | 2022-01-19 | - |
dc.date.issued | 2021-11 | - |
dc.identifier.issn | 2079-9292 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/135966 | - |
dc.description.abstract | Deep learning for 3D data has become a popular research theme in many fields. However, most of the research on 3D data is based on voxels, 2D images, and point clouds. At actual industrial sites, face-based geometry data are being used, but their direct application to industrial sites remains limited due to a lack of existing research. In this study, to overcome these limitations, we present a face-based variational autoencoder (FVAE) model that generates 3D geometry data using a variational autoencoder (VAE) model directly from face-based geometric data. Our model improves the existing node and edge-based adjacency matrix and optimizes it for geometric learning by using a face- and edge-based adjacency matrix according to the 3D geometry structure. In the experiment, we achieved the result of generating adjacency matrix information with 72% precision and 69% recall through end-to-end learning of Face-Based 3D Geometry. In addition, we presented various structurization methods for 3D unstructured geometry and compared their performance, and proved the method to effectively perform reconstruction of the learned structured data through experiments. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | MDPI | - |
dc.title | FaceVAE: Generation of a 3D Geometric Object Using Variational Autoencoders | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Hyeoncheol | - |
dc.identifier.doi | 10.3390/electronics10222792 | - |
dc.identifier.scopusid | 2-s2.0-85118951082 | - |
dc.identifier.wosid | 000724030800001 | - |
dc.identifier.bibliographicCitation | ELECTRONICS, v.10, no.22 | - |
dc.relation.isPartOf | ELECTRONICS | - |
dc.citation.title | ELECTRONICS | - |
dc.citation.volume | 10 | - |
dc.citation.number | 22 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordAuthor | 3D geometry | - |
dc.subject.keywordAuthor | VAE | - |
dc.subject.keywordAuthor | deep learning | - |
dc.subject.keywordAuthor | generation model | - |
dc.subject.keywordAuthor | graph data | - |
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