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Giant Thermoelectric Seebeck Coefficients in Tellurium Quantum Wires Formed Vertically in an Aluminum Oxide Layer by Electrical Breakdown

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dc.contributor.authorPark, No-Won-
dc.contributor.authorKim, Hanul-
dc.contributor.authorLee, Won-Yong-
dc.contributor.authorKim, Gil-Sung-
dc.contributor.authorKang, Dae Yun-
dc.contributor.authorKim, Tae Geun-
dc.contributor.authorSaitoh, Eiji-
dc.contributor.authorYoon, Young-Gui-
dc.contributor.authorRho, Heesuk-
dc.contributor.authorLee, Sang-Kwon-
dc.date.accessioned2022-02-21T14:42:53Z-
dc.date.available2022-02-21T14:42:53Z-
dc.date.created2022-02-07-
dc.date.issued2021-09-02-
dc.identifier.issn1948-7185-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/136393-
dc.description.abstractHigh efficiency thermoelectric (TE) materials still require high thermopower for energy harvesting applications. A simple elemental metallic semiconductor, tellurium (Te), has been considered critical to realize highly efficient TE conversion due to having a large effective band valley degeneracy. This paper demonstrates a novel approach to directly probe the out-of-plane Seebeck coefficient for one-dimensional Te quantum wires (QWs) formed locally in the aluminum oxide layer by well-controlled electrical breakdown at 300 K. Surprisingly, the out-of-plane Seebeck coefficient for these Te QWs approximate to 0.8 mV/K at 300 K. This thermopower enhancement for Te QWs is due to Te intrinsic nested band structure and enhanced energy filtering at Te/AO interfaces. Theoretical calculations support the enhanced high Seebeck coefficient for elemental Te QWs in the oxide layer. The local-probed observation and detecting methodology used here offers a novel route to designing enhanced thermoelectric materials and devices in the future.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER CHEMICAL SOC-
dc.titleGiant Thermoelectric Seebeck Coefficients in Tellurium Quantum Wires Formed Vertically in an Aluminum Oxide Layer by Electrical Breakdown-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Tae Geun-
dc.identifier.doi10.1021/acs.jpclett.1c01842-
dc.identifier.scopusid2-s2.0-85114428469-
dc.identifier.wosid000693398700009-
dc.identifier.bibliographicCitationJOURNAL OF PHYSICAL CHEMISTRY LETTERS, v.12, no.34, pp.8212 - 8219-
dc.relation.isPartOfJOURNAL OF PHYSICAL CHEMISTRY LETTERS-
dc.citation.titleJOURNAL OF PHYSICAL CHEMISTRY LETTERS-
dc.citation.volume12-
dc.citation.number34-
dc.citation.startPage8212-
dc.citation.endPage8219-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Atomic, Molecular & Chemical-
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