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A 65-nm 0.6-fJ/Bit/Search Ternary Content Addressable Memory Using an Adaptive Match-Line Discharge

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dc.contributor.authorLee, Kyeongho-
dc.contributor.authorChoi, Woong-
dc.contributor.authorPark, Jongsun-
dc.date.accessioned2022-02-25T20:41:31Z-
dc.date.available2022-02-25T20:41:31Z-
dc.date.created2022-02-09-
dc.date.issued2021-08-
dc.identifier.issn0018-9200-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/136908-
dc.description.abstractThis article presents an adaptive match-line (ML) discharge scheme for low-power, high-performance, and compact ternary content addressable memory (TCAM). In the proposed TCAM, the transposed cell topology enables the selectively controlled ML pull-down path and compact array area. By employing the adaptive ML discharge and ML boosting scheme, unnecessary ML discharge and redundant search-line (SL) switching are eliminated for low-cost TCAM search operation. In order to minimize ML voltage swing at a wide voltage range, a timing calibration scheme is also adopted in the proposed TCAM. A 128 x 64 test chip implemented with 65-nm CMOS technology shows that the proposed adaptive ML discharge improves up to 69% of search delay and saves 37% of search energy compared with the conventional approach at 1.1 V, 100 MHz. The measurement result shows energy efficiency of 0.6 fJ/bit/search and 8% improvement of figure-of-merit (FoM) (energy/bit/search) compared with the state-of-the-art works.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectLOW-POWER CAM-
dc.subjectDESIGN-
dc.subjectSCHEME-
dc.subjectNOISE-
dc.titleA 65-nm 0.6-fJ/Bit/Search Ternary Content Addressable Memory Using an Adaptive Match-Line Discharge-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Jongsun-
dc.identifier.doi10.1109/JSSC.2020.3043186-
dc.identifier.scopusid2-s2.0-85098767831-
dc.identifier.wosid000678340400023-
dc.identifier.bibliographicCitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.56, no.8, pp.2574 - 2584-
dc.relation.isPartOfIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.titleIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.volume56-
dc.citation.number8-
dc.citation.startPage2574-
dc.citation.endPage2584-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusLOW-POWER CAM-
dc.subject.keywordPlusNOISE-
dc.subject.keywordPlusSCHEME-
dc.subject.keywordAuthorAdaptive sensing-
dc.subject.keywordAuthorcontent addressable memory (CAM)-
dc.subject.keywordAuthormemory-
dc.subject.keywordAuthorreference voltage-
dc.subject.keywordAuthorsensing margin-
dc.subject.keywordAuthorternary CAM (TCAM)-
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