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Similarity-based Local Feature Extraction for Wafer Bin Map Pattern RecognitionSimilarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition
- Alternative Title
- Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition
- Authors
- Jun-Geol Baek
- Issue Date
- 22-2월-2022
- Publisher
- KICS
- Citation
- The 4th International Conference on Artificial Intelligence in Information and Communication (ICAIIC 2022)
- Conference Name
- The 4th International Conference on Artificial Intelligence in Information and Communication (ICAIIC 2022)
- Place
- KO
Jeju, Korea
- Conference Date
- 2022-02-21
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