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Riding the IoT Wave With VFuzz: Discovering Security Flaws in Smart Homes

Authors
Nkuba, Carlos KayembeKim, SeulbaeDietrich, SvenLee, Heejo
Issue Date
2022
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Security; Smart homes; Protocols; Testing; Encryption; Fuzzing; Payloads; Smart home security; Z-Wave; Internet of Things; fuzzing; vulnerabilities discovery
Citation
IEEE ACCESS, v.10, pp.1775 - 1789
Indexed
SCIE
SCOPUS
Journal Title
IEEE ACCESS
Volume
10
Start Page
1775
End Page
1789
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/137600
DOI
10.1109/ACCESS.2021.3138768
ISSN
2169-3536
Abstract
Z-Wave smart home Internet of Things devices are used to save energy, increase comfort, and remotely monitor home activities. In the past, security researchers found Z-Wave device vulnerabilities through reverse engineering, manual audits, and penetration testing. However, they did not fully use fuzzing, which is an automated cost-effective testing technique. Thus, in this paper, we present VFUZZ, a protocol-aware blackbox fuzzing framework for quickly assessing vulnerabilities in Z-Wave devices. VFUZZ assesses the target device capabilities and encryption support to guide seed selection and tests the target for new vulnerability discovery. It uses our field prioritization algorithm (FIPA), which mutates specific Z-Wave frame fields to ensure the validity of the generated test cases. We assessed VFUZZ on a real Z-Wave network consisting of 19 Z-Wave devices ranging from legacy to recent ones, as well as different device types. Our VFUZZ evaluation found 10 distinct security vulnerabilities and seven crashes among the tested devices and yielded six unique common vulnerabilities and exposures (CVE) identifiers related to the Z-Wave chipset.
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