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금 나노 입자와 표면전하현미경을 이용한 고민감도 알루미늄 이온 검출

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dc.contributor.authorPARK, Jinsung-
dc.date.accessioned2021-08-27T18:03:06Z-
dc.date.available2021-08-27T18:03:06Z-
dc.date.created2021-04-22-
dc.date.issued2019-04-18-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/13847-
dc.publisher대한기계학회-
dc.title금 나노 입자와 표면전하현미경을 이용한 고민감도 알루미늄 이온 검출-
dc.title.alternativeHigh sensitivity aluminum ion detection using gold nanoparticles and Kelvin Probe Force Microscope-
dc.typeConference-
dc.contributor.affiliatedAuthorPARK, Jinsung-
dc.identifier.bibliographicCitation대한기계학회 CAE 및 응용역학부문-
dc.relation.isPartOf대한기계학회 CAE 및 응용역학부문-
dc.relation.isPartOf대한기계학회 CAE 및 응용역학부문 2019년도 춘계학술대회 프로그램-
dc.citation.title대한기계학회 CAE 및 응용역학부문-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2019-04-18-
dc.type.rimsCONF-
dc.description.journalClass2-
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