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금 나노 입자와 표면전하현미경을 이용한 고민감도 알루미늄 이온 검출High sensitivity aluminum ion detection using gold nanoparticles and Kelvin Probe Force Microscope

Alternative Title
High sensitivity aluminum ion detection using gold nanoparticles and Kelvin Probe Force Microscope
Authors
PARK, Jinsung
Issue Date
18-4월-2019
Publisher
대한기계학회
Citation
대한기계학회 CAE 및 응용역학부문
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/13847
Conference Name
대한기계학회 CAE 및 응용역학부문
Place
KO
Conference Date
2019-04-18
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Graduate School > Department of Control and Instrumentation Engineering > 2. Conference Papers

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