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Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error ResilienceStealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience
- Alternative Title
- Stealth ECC: A Data-Width Aware Adaptive ECC Scheme for DRAM Error Resilience
- Authors
- Gunjae Koo
- Keywords
- DRAM reliability, narrow-width value, error correction code, chip error resilience
- Issue Date
- 17-3월-2022
- Publisher
- IEEE, ACM
- Citation
- 2022 Design, Automation and Test in Europe Conference (DATE 2022), pp.382 - 387
- Conference Name
- 2022 Design, Automation and Test in Europe Conference (DATE 2022)
- Place
- BE
Antwerp, Belgium (Virtual)
- Conference Date
- 2022-03-14
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