Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Feature Based Sampling: A Fast and Robust Sampling Method for Tasks Using 3D Point Cloudopen access

Authors
Han, Jung-WooSynn, Dong-JooKim, Tae-HyeongChung, Hae-ChunKim, Jong-Kook
Issue Date
2022
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Point cloud compression; Task analysis; Sampling methods; Feature extraction; Time complexity; Indexes; Encoding; Artificial intelligence (AI); point-wise MLP; layered architecture; machine learning; 3D point cloud; sampling methods
Citation
IEEE ACCESS, v.10, pp.58062 - 58070
Indexed
SCIE
SCOPUS
Journal Title
IEEE ACCESS
Volume
10
Start Page
58062
End Page
58070
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/143993
DOI
10.1109/ACCESS.2022.3178519
ISSN
2169-3536
Abstract
Point cloud data sets are frequently used in machines to sense the real world because sensors such as LIDAR are readily available to be used in many applications including autonomous cars and drones. PointNet and PointNet++ are widely used point-wise embedding methods for interpreting Point clouds. However, even for recent models based on PointNet, real-time inference is still challenging. The solution to a faster inference is sampling, where, sampling is a method to reduce the number of points that is computed in the next module. Furthest Point Sampling (FPS) is widely used, but disadvantage is that it is slow and it is difficult to select critical points. In this paper, we introduce Feature-Based Sampling (FBS), a novel sampling method that applies the attention technique. The results show a significant speedup of the training time and inference time while the accuracy is similar to previous methods. Further experiments demonstrate that the proposed method is better suited to preserve critical points or discard unimportant points.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Jong Kook photo

Kim, Jong Kook
College of Engineering (School of Electrical Engineering)
Read more

Altmetrics

Total Views & Downloads

BROWSE