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정량적 특허지표를 이용한 특허정보 분석정량적 특허지표를 이용한 특허정보 분석
- Alternative Title
- 정량적 특허지표를 이용한 특허정보 분석
- Authors
- Park Sang Sung
- Issue Date
- 21-4월-2018
- Publisher
- 한국지능시스템학회
- Citation
- 한국지능시스템학회 2018년도 춘계학술대회
- Conference Name
- 한국지능시스템학회 2018년도 춘계학술대회
- Place
- KO
- Conference Date
- 2018-04-20
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Collections - Graduate School > Graduate School of management of technology > 2. Conference Papers
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