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A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DACA 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DAC
- Alternative Title
- A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DAC
- Authors
- Lee, Hyung-Min
- Issue Date
- 13-2월-2018
- Publisher
- IEEE
- Citation
- IEEE Int. Solid-State Circuits Conf. (ISSCC)
- Conference Name
- IEEE Int. Solid-State Circuits Conf. (ISSCC)
- Place
- US
San Francisco, CA, USA
- Conference Date
- 2018-02-11
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- Appears in
Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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