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Generation of depth-selectivity for reflection phase microscopy by accumulation of interferogramsGeneration of depth-selectivity for reflection phase microscopy by accumulation of interferograms
- Alternative Title
- Generation of depth-selectivity for reflection phase microscopy by accumulation of interferograms
- Authors
- Choi, Youngwoon
- Issue Date
- 29-1월-2018
- Publisher
- SPIE
- Citation
- SPIE Photonics West 2018
- Conference Name
- SPIE Photonics West 2018
- Place
- US
- Conference Date
- 2018-01-27
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Collections - Graduate School > Department of Bioengineering > 2. Conference Papers
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