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Removal of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detectionRemoval of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detection

Alternative Title
Removal of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detection
Authors
Choi, Youngwoon
Issue Date
29-1월-2018
Publisher
SPIE
Citation
SPIE Photonics West 2018
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/20368
Conference Name
SPIE Photonics West 2018
Place
US
Conference Date
2018-01-27
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Graduate School > Department of Bioengineering > 2. Conference Papers

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