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NTV 환경에서 Hamming ECC와 BCH ECC 기법의 에러 커버리지와 전력간의 Trade-off 분석

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dc.contributor.authorKim, Seon Wook-
dc.date.accessioned2021-08-28T02:43:43Z-
dc.date.available2021-08-28T02:43:43Z-
dc.date.created2021-04-22-
dc.date.issued2017-11-25-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/20878-
dc.publisher대한전자공학회-
dc.titleNTV 환경에서 Hamming ECC와 BCH ECC 기법의 에러 커버리지와 전력간의 Trade-off 분석-
dc.title.alternativeStudy of Trade-off between Error Coverage and Power Consumption for Hamming ECC and BCH ECC under NTV Environment-
dc.typeConference-
dc.contributor.affiliatedAuthorKim, Seon Wook-
dc.identifier.bibliographicCitation2017년도 대한전자공학회 정기총회 및 추계학술대회-
dc.relation.isPartOf2017년도 대한전자공학회 정기총회 및 추계학술대회-
dc.relation.isPartOf2017년도 대한전자공학회 정기총회 및 추계학술대회-
dc.citation.title2017년도 대한전자공학회 정기총회 및 추계학술대회-
dc.citation.conferencePlaceKO-
dc.citation.conferenceDate2017-11-24-
dc.type.rimsCONF-
dc.description.journalClass2-
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공과대학 (전기전자공학부)
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