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Surface potential characterization of DNA capped nanoparticles for point mutation detectionSurface potential characterization of DNA capped nanoparticles for point mutation detection
- Alternative Title
- Surface potential characterization of DNA capped nanoparticles for point mutation detection
- Authors
- Dae Sung Yoon
- Keywords
- KPFM, Point mutation detection, DNA
- Issue Date
- 13-7월-2017
- Publisher
- IEEE
- Citation
- EMBC 2017
- Conference Name
- EMBC 2017
- Place
- KO
ICC, 제주
- Conference Date
- 2017-07-11
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - Graduate School > Department of Bioengineering > 2. Conference Papers
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