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Three Radiation Resistant Techniques against Single Event Effect for SAR-ADC Design
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yeom Jung Yeol | - |
| dc.date.accessioned | 2021-08-28T06:44:46Z | - |
| dc.date.available | 2021-08-28T06:44:46Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2017-07-04 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/23310 | - |
| dc.publisher | IEEE | - |
| dc.title | Three Radiation Resistant Techniques against Single Event Effect for SAR-ADC Design | - |
| dc.title.alternative | Three Radiation Resistant Techniques against Single Event Effect for SAR-ADC Design | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Yeom Jung Yeol | - |
| dc.identifier.bibliographicCitation | 2017 International Workshop on Radiation Imaging Detectors (iWoRiD 2017), Krakow, Poland | - |
| dc.relation.isPartOf | 2017 International Workshop on Radiation Imaging Detectors (iWoRiD 2017), Krakow, Poland | - |
| dc.relation.isPartOf | 2017 International Workshop on Radiation Imaging Detectors (iWoRiD 2017), Krakow, Poland | - |
| dc.citation.title | 2017 International Workshop on Radiation Imaging Detectors (iWoRiD 2017), Krakow, Poland | - |
| dc.citation.conferencePlace | PL | - |
| dc.citation.conferenceDate | 2017-07-02 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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