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Three Radiation Resistant Techniques against Single Event Effect for SAR-ADC DesignThree Radiation Resistant Techniques against Single Event Effect for SAR-ADC Design

Alternative Title
Three Radiation Resistant Techniques against Single Event Effect for SAR-ADC Design
Authors
Yeom Jung Yeol
Issue Date
4-7월-2017
Publisher
IEEE
Citation
2017 International Workshop on Radiation Imaging Detectors (iWoRiD 2017), Krakow, Poland
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/23310
Conference Name
2017 International Workshop on Radiation Imaging Detectors (iWoRiD 2017), Krakow, Poland
Place
PL
Conference Date
2017-07-02
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Graduate School > Department of Bioengineering > 2. Conference Papers

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