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Radiation Hardened Successive-Approximation ADC with Error Detection Circuits
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yeom Jung Yeol | - |
| dc.date.accessioned | 2021-08-28T07:27:00Z | - |
| dc.date.available | 2021-08-28T07:27:00Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2017-06-14 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/23682 | - |
| dc.publisher | American Nuclear Society | - |
| dc.title | Radiation Hardened Successive-Approximation ADC with Error Detection Circuits | - |
| dc.title.alternative | Radiation Hardened Successive-Approximation ADC with Error Detection Circuits | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | Yeom Jung Yeol | - |
| dc.identifier.bibliographicCitation | 2017 American Nuclear Society, ANS Annual Meeting, San Francisco, CA, USA, | - |
| dc.relation.isPartOf | 2017 American Nuclear Society, ANS Annual Meeting, San Francisco, CA, USA, | - |
| dc.relation.isPartOf | American Nuclear Society, ANS Annual Meeting | - |
| dc.citation.title | 2017 American Nuclear Society, ANS Annual Meeting, San Francisco, CA, USA, | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.conferenceDate | 2017-06-11 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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Collections - Graduate School > Department of Bioengineering > 2. Conference Papers
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