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Radiation Hardened Successive-Approximation ADC with Error Detection CircuitsRadiation Hardened Successive-Approximation ADC with Error Detection Circuits

Alternative Title
Radiation Hardened Successive-Approximation ADC with Error Detection Circuits
Authors
Yeom Jung Yeol
Issue Date
14-6월-2017
Publisher
American Nuclear Society
Citation
2017 American Nuclear Society, ANS Annual Meeting, San Francisco, CA, USA,
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/23682
Conference Name
2017 American Nuclear Society, ANS Annual Meeting, San Francisco, CA, USA,
Place
US
Conference Date
2017-06-11
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Graduate School > Department of Bioengineering > 2. Conference Papers

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