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Influence of AlN buffer layer crystallinity on the properties of GaN epilayer on sapphire by MOCVDInfluence of AlN buffer layer crystallinity on the properties of GaN epilayer on sapphire by MOCVD

Alternative Title
Influence of AlN buffer layer crystallinity on the properties of GaN epilayer on sapphire by MOCVD
Authors
BYUN, Dong Jin
Issue Date
19-5월-2016
Publisher
한국재료학회
Citation
2016년도 한국재료학회 춘계학술대회
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/29315
Conference Name
2016년도 한국재료학회 춘계학술대회
Place
KO
Conference Date
2016-05-18
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BYUN, Dong Jin
공과대학 (신소재공학부)
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