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단계적 SVM(Support Vector Machine)을 이용한 반도체 제조공정에서 최종검사 공정 수율 예측 방법론
- Authors
- KIM SUNG SHICK
- Issue Date
- 22-May-2009
- Conference Name
- 한국경영과학회/대한산업공학회 춘계공동학술대회 논문집
- Place
- 대한민국
부산대학교
- Conference Date
- 2009-05-22 ~ 2009-05-23
- Conference Name
- 한국경영과학회/대한산업공학회 춘계공동학술대회
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Collections - College of Engineering > ETC > 2. Conference Papers
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