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단계적 SVM(Support Vector Machine)을 이용한 반도체 제조공정에서 최종검사 공정 수율 예측 방법론
- Authors
- KIM SUNG SHICK
- Issue Date
- 22-5월-2009
- Publisher
- 한국경영과학회/대한산업공학회
- Citation
- 한국경영과학회/대한산업공학회 춘계공동학술대회
- Conference Name
- 한국경영과학회/대한산업공학회 춘계공동학술대회
- Place
- KO
부산대학교
- Conference Date
- 2009-05-22
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