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Measuring the Thermal Conductivity of Bi2Te3 Nanowire With Scanning Thermal Wave Microscopy in a vacuum environment
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KWON, Oh Myoung | - |
| dc.date.accessioned | 2021-08-29T01:31:35Z | - |
| dc.date.available | 2021-08-29T01:31:35Z | - |
| dc.date.created | 2021-04-22 | - |
| dc.date.issued | 2015-05-22 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/34585 | - |
| dc.publisher | 대한기계학회 | - |
| dc.title | Measuring the Thermal Conductivity of Bi2Te3 Nanowire With Scanning Thermal Wave Microscopy in a vacuum environment | - |
| dc.title.alternative | Measuring the Thermal Conductivity of Bi2Te3 Nanowire With Scanning Thermal Wave Microscopy in a vacuum environment | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | KWON, Oh Myoung | - |
| dc.identifier.bibliographicCitation | 2015년도 마이크로/나노공학부문 춘계학술대회, pp.58 | - |
| dc.relation.isPartOf | 2015년도 마이크로/나노공학부문 춘계학술대회 | - |
| dc.relation.isPartOf | 대한기계학회 마이크로/나노공학부문 | - |
| dc.citation.title | 2015년도 마이크로/나노공학부문 춘계학술대회 | - |
| dc.citation.startPage | 58 | - |
| dc.citation.endPage | 58 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 부산 BEXCO 컨벤션홀 | - |
| dc.citation.conferenceDate | 2015-05-21 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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