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Modeling of Leakage Current Characteristics for Low Temperature Gate Insulator Using Genetic AlgorithmModeling of leakage current characteristics for low temperature gate insulator using genetic algorithm

Alternative Title
Modeling of leakage current characteristics for low temperature gate insulator using genetic algorithm
Authors
PARK KANG-BAK
Issue Date
9-7월-2014
Publisher
KVS
Citation
ICMAP2014
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/39529
Conference Name
ICMAP2014
Place
KO
Conference Date
2014-07-08
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College of Science and Technology > Department of Electro-Mechanical Systems Engineering > 2. Conference Papers

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PARK, KANG BAK
과학기술대학 (전자·기계융합공학과)
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