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Stabilization of negative bias illumination stress induced instability on electrical characteristics of amorphous oxide thin film transistor integrated with plasmonic filter,Stabilization of negative bias illumination stress induced instability on electrical characteristics of amorphous oxide thin film transistor integrated with plasmonic filter,
- Alternative Title
- Stabilization of negative bias illumination stress induced instability on electrical characteristics of amorphous oxide thin film transistor integrated with plasmonic filter,
- Authors
- Ju, Byeongkwon
- Issue Date
- 24-4월-2014
- Publisher
- SETCOR
- Citation
- Int. Conf. Nanotech MEET
- Conference Name
- Int. Conf. Nanotech MEET
- Place
- TI
- Conference Date
- 2014-04-24
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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