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SCIE
SCOPUS
Shielding region effects on a trench gate IGBT
Lee, Jong-Seok; Kang, Ey-Goo; Sung, Man Young
Article
Issue Date
2008
Citation
MICROELECTRONICS JOURNAL, v.39, no.1, pp.57 - 62
Publisher
ELSEVIER SCI LTD
1
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Author
Lee, Jong-Seok
1
Sung, Man Young
1
Subject
breakdown voltage
1
ELECTRODE IGBT
1
IGBT
1
on-state voltage drop
1
shielding region
1
trench
1
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English
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scie
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scopus
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