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널포인트 주사탐치열현미경을 이용한 SOI 기판 위의 전기적으로 가열된 나노 히터 주변 온도분포 정량적 계측

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dc.contributor.authorKWON, Oh Myoung-
dc.date.accessioned2021-08-29T14:23:36Z-
dc.date.available2021-08-29T14:23:36Z-
dc.date.created2021-04-22-
dc.date.issued2013-12-20-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/42163-
dc.publisher대한기계학회-
dc.title널포인트 주사탐치열현미경을 이용한 SOI 기판 위의 전기적으로 가열된 나노 히터 주변 온도분포 정량적 계측-
dc.title.alternativequantitative temperature profiling across the electrically heated nano-heater on silicon-on-insulator using null point scanning thermal microscopy-
dc.typeConference-
dc.contributor.affiliatedAuthorKWON, Oh Myoung-
dc.identifier.bibliographicCitation대한기계학회 2013 마이크로/나노공학부문 추계학술대회-
dc.relation.isPartOf대한기계학회 2013 마이크로/나노공학부문 추계학술대회-
dc.relation.isPartOf대한기계학회 2013 마이크로/나노공학부문 추계학술대회 논문집-
dc.citation.title대한기계학회 2013 마이크로/나노공학부문 추계학술대회-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace강원도-
dc.citation.conferenceDate2013-12-19-
dc.type.rimsCONF-
dc.description.journalClass2-
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공과대학 (기계공학부)
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